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dimanche 21 décembre 2014

[tel-01095529] INTERACTION LASER-NANOPOINTE SOUS CHAMP ELECTRIQUE INTENSE : APPLICATION A LA SONDE ATOMIQUE

The goal of this work is a better understanding of the different physical processes which occurs during field evaporation of atoms. There is some considerations applied both to metalic and non-metalic case and with the atom probe tomography analysis technik. This work allows us to use different parameters to optimize the experimental condictions in atom probe to obtain the best results avaible.



from HAL : Dernières publications http://ift.tt/1pxeyHF

Ditulis Oleh : Unknown // 08:28
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